Noncontact Atomic Force Microscopy PDF Download. Download free ebook of Noncontact Atomic Force Microscopy in PDF format or read online by S. Morita,Roland Wiesendanger,E. Meyer 9783540431176 Published on 2002-07-24 by Springer Science & Business Media
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.
This Book was ranked at 30 by Google Books for keyword Microscopy.
Book ID of Noncontact Atomic Force Microscopy's Books is omrO6fIgfSMC, Book which was written by S. Morita,Roland Wiesendanger,E. Meyer have ETAG "D5OIo56IQOY"
Book which was published by Springer Science & Business Media since 2002-07-24 have ISBNs, ISBN 13 Code is 9783540431176 and ISBN 10 Code is 3540431179
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Book which have "439 Pages" is Printed at BOOK under CategoryScience
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