Characterization of High Tc Materials and Devices by Electron Microscopy PDF Download. Download free ebook of Characterization of High Tc Materials and Devices by Electron Microscopy in PDF format or read online by Nigel D. Browning,Stephen J. Pennycook 9781139429160 Published on 2000-07-06 by Cambridge University Press
This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
This Book was ranked at 33 by Google Books for keyword Microscopy.
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Book which was published by Cambridge University Press since 2000-07-06 have ISBNs, ISBN 13 Code is 9781139429160 and ISBN 10 Code is 1139429167
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